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Spectral Ripple & FSRFabry-Perot Diagnostics

Every periodic spectral ripple traces back to a pair of reflecting surfaces forming a Fabry-Perot cavity — measure the period and you locate it.

R₁ R₂ round trip → path 2·n·L L (index n) FSR periodic ripple on spectrum
Two reflecting surfaces (R₁, R₂) + medium n, length L → spectral period FSR = λ²/(2·n·L)
A · Ripple Period ↔ Cavity Length
B · Reflectivity → Ripple Depth
Modulation depth (p-p)
FSR = λ²2 · n · L contrast ≈ 4·√(R₁R₂)(1+√(R₁R₂))² For small R, contrast ≈ 4·√(R₁R₂); dB = 10·log₁₀(contrast)
AR reflectivity → FP modulation depth (from the formula above; both surfaces down one decade → ≈10 dB lower)
R₁R₂Depth
1%1%−14 dB
0.5%0.5%−17 dB
0.1%0.1%−24 dB
0.05%0.05%−27 dB
0.01%0.01%−34 dB
Common air-gap lengths → FSR (@1310 nm)
Air gapFSRTypical origin
0.34 mm2522 pmThin-element (polarizer-class) gap
1.00 mm858 pmMemory anchor: 1 mm ↔ 858 pm
1.57 mm547 pmLens–window gap scale
6.00 mm143 pmLong cavity (e.g. 1.7 mm InP chip × n3.5 equivalent)

Solving the case by ripple period

When periodic ripple appears on a device spectrum, measure its period (FSR) and back out the equivalent n·L cavity length, then check it against the thickness × index of every element in the package: the chip waveguide itself (InP, n≈3.5), collimating lens, window, polarizer, epoxy gaps… each candidate has a unique signature period. Example: 144 pm ripple on a 1310 nm device gives n·L ≈ 5.95 mm — exactly the round-trip of a 1.7 mm InP chip (×3.5), pointing to residual facet reflection rather than a packaging element.

What it means for users

For OCT / interferometric applications, spectral ripple appears in the coherence domain as a secondary coherence peak (ghost) at the equivalent path n·L, with amplitude tracking the ripple depth — which is why low ripple is a key SLD deliverable. Two engineering countermeasures: AR coating — every decade of reflectivity reduction on both surfaces cuts ripple depth by ~10 dB (table above); and tilting elements so reflections walk off the optical path — the reflected beam deviates by 2θ and walks off by L·tan(2θ), so thin (short-cavity) elements need larger tilts. Our SLD packaging uses both, and every unit is screened for ripple on an OSA.

Related Products

Related tools: Coherence length · PM polarization beat · dB↔linear ratio

※ Formulas on this page assume ideal models; all device parameters shown are typical values — refer to the datasheet and the serialized factory test report shipped with each unit. For selection support, contact sales@lncetek.com.